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Further
Information on
Dual
Wavelength
Interferometers
Infrared
Interferometers
Grazing
Incidence
Interferometers
Graham
Product Line
Why
Grazing Incidence?
How
Phase Works
Tutorials
Printable Brochures
1060
nm / 635 nm Models
1550
nm / 635 nm Models
3390
nm / 635 nm Models
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MODEL 106irVIS
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MODEL 155irVIS
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MODEL 339irVIS
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| CONVENIENCE.
Probably
the most important advantage is the convenience of making measurements
in the infrared or the visible with the same interferometer -- WITHOUT
THE NEED TO REALIGN the test piece! This saves a lot of setup
time.
It
also makes it possible to do the basic alignment with the visible beam
--often a great deal easier when you can see the beam -- then switching
to the ir beam after the centering and tip/tilting is done. |
| DYNAMIC
RANGE EXTENSION. Accurate measurement of a surface with greater
departure from flat (or spherical) may be difficult when the wavelength
of the test beam is relatively short (632.8 nM). It may not be easy
to get good repeatable data when the departure exceeds 40 fringes. This
is a case where the longer wavelength of the infrared can be put to good
use to reduce the number of fringes substantially. |
| SPACE
SAVING. Of course such infrared and visible interferograms could
be made with two separate interferometers. Aside from the additional
setup time -- a lot more real estate must be devoted to two separate interferometers. |
| COST.
While dual-wavelength interferometers are more expensive than single wavelength
instruments, the cost is less than for two separate instruments -- as much
as 22.5% less for some Graham Models, but the ongoing, day-to-day savings
in time spent aligning test pieces greatly overshadows any capital cost
saving. |
For
Further Information, call Gordon Graham today at (818) 700-1263
E-mail: techinfo@grahamoptical.com
Graham
Optical Systems,
9530 Topanga Canyon Blvd.,
Chatsworth, CA 91311
Copyright
© 2011 Graham Optical Systems All Rights Reserved
This page last updated November 20, 2011
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