Model 155irVIS DUAL WAVELENGTH 
1550 nM / 635 nM
Phase Interferometer

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 The Model 155irVIS is one of our new Phase-shifting Fizeau Interferometers that operates in two modes: Infrared or Visible—switch selectable. The instrument features a fused silica collimator. Two separate lasers are employed – a single mode diode laser operating at 1550 nM and single mode diode laser operating at 635 nm.  Both sources are dithered to produce speckle-free live images on the computer monitor.  Two cameras are used – one with sensitivity at 1550 nM; the other is used for the visible.  The infrared camera provides a resolution of 320 x 256 pixels. The visible wavelength camera provide resolution of  768 x 494 pixels.

The Model 155irVIS utilizes EndoPhazeTM for hysteresis-free phase shifting together with Durango Universal Interferometry Software to allow the operator to achieve highly accurate and repeatable measurements at both infrared and visible wavelengths. In typical usage of a Dual Wavelength Interferometer, the operator can align the optical system and perform any necessary tip/tilt operations with the interferometer in VISIBLE MODE—greatly simplifying the procedure.  Measurement of reflective surfaces can also be measured at 635 nm – providing higher accuracy. 

Featuring Zoom optics, with remote control of Zoom, Focus, Iris and Illumination control at both wavelengths, the Model 155irVIS is equipped with a 3.02 GHz computer with INTEL® Core™ i-3 540 processor and 22-inch TFT flat screen monitor.
 
FEATURE
BENEFIT
Dual Wavelength 1550 nM / 635 nM switch selectable. Alignment of two wavelength optical paths is coaxial
4-inch aperture  Ideal for test pieces from 1/2 to 4 inch diameter
Tip / Tilt plate for mounting of Transmission flats or Transmission spheres Transmission flat (1/20 wave at 635 nm) provided.
Transmission spheres and pellicles available.
ZOOM Lens 4X for both wavelengths Remote controlled for hands-off operation.
Rugged construction High mechanical stability
A Turnkey System User Friendly and ready to go
Two spot alignment For quick setup on each new part tested.  Setup of test piece at either wavelength is aligned at both wavelengths
Dithered Laser sources at 1550 nM and 635 nM Sharp Speckle-free interferogram at both wavelengths
EndoPhazeTM Phase Shifter For smooth hysteresis-free operation
635 nm CCD camera Resolution 768 x 494 pixels
1550 nm Camera Resolution 320 x 256 pixels
Durango Universal Interferometry Software* Windows environment
PV and rms in users choice of units
High level of repeatability
Excellent reproducibility
Large choice of graphic displays
Dynamic Sections
3-D OPD Plot
Reference Subtraction
MTF and PSF graphics and plots
Zernike Polynomials available for all measurements
Seidel Coefficients available
3.02 GHz computer with INTEL® Core™ i-3 540 processor For high speed data reduction and phase shift control
22-inch TFT Flat Screen Monitor For easy viewing
Live interferogram on computer monitor For quick inspection with no extra video monitor
Image acquisition board  Installed in computer and configured for the 155irVIS
Data acquisition Board Installed in computer and configured for the 155irVIS
1/50 wave at 1550 nM, 
1/20 wave at 632.8 nM		 High Accuracy 
Repeatability 1/300 wave PV,  1/1000 wave rms
Reproducibility Excellent
Data acquisition Time 30 milliseconds (typical)
Data reduction time  ~3 seconds (typical)		 Fast!
Dimensions (L x W x H) 20 x 18 x 10 (inches) Small footprint
Weight 75 pounds (34 kg) approximately Solidly built for high stability
Manual Illustrated Operator's Manual
Power  115/240 Volts  50/60 Hz Wired with proper plug for user's power system
Warranty Standard one-year limited warranty against defective components or workmanship


For Further Information, call Gordon Graham today at (818) 700-1263  E-Mail: techinfo@grahamoptical.com
Graham Optical Systems,   9530 Topanga Canyon Blvd.,   Chatsworth, CA 91311
Copyright © 2011 Graham Optical Systems  All Rights Reserved
*Durango is a trademark of Diffraction International   EndoPhazeTM  is a trademark of Graham Optical Systems
This page last updated November 25, 2011