Fizeau Interferometers

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  Interferometers

  Infrared Interferometers

  Grazing Incidence
  Interferometers

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  Why Grazing Incidence?

  How Phase Works

  Advantages of Dual 
  Wavelength Interferometers

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The Model 155irVIS utilizes piezo-electric phase shifters and Durango Universal Interferometry Software to allow the operator to achieve highly accurate and repeatable measurements at both infrared and visible wavelengths. In typical usage of a Dual Wavelength Interferometer, the operator can align his optical system and perform any necessary tip/tilt operations with the interferometer in VISIBLE MODE—greatly simplifying the procedure.  Measurement of reflective surfaces can also be measured at 632.8 nM – providing higher accuracy. 

Featuring Illumination control, zoom optics, piezo-electric phase shifter,  the Model 155irVIS is equipped with Durango Universal Interferometry Software, 3 GHz Pentium 4 Computer, and 19-inch TFT flat screen monitor.
 

FEATURE	BENEFIT
Dual Wavelength 1550 nM / 632.8 nM	Alignment of two wavelength optical paths is coaxial
4-inch aperture	Ideal for test pieces from 1/2 to 4 inch diameter
Fused silica reference surface	1/32 wave at 1550 nM  1/20 wave at 632.8 nM
ZOOM Lens 4X for both wavelengths	Readily accommodates test pieces from 1/2 inch to 4 inches diameter
Rugged construction	High mechanical stability
A Turnkey System	User Friendly and ready to go
Two spot alignment	For quick setup on each new part tested.  Setup of test piece at either wavelength is aligned at both wavelengths
Dithered Laser sources at 1550 nM and 632.8 nM	Sharp Speckle-free interferogram at both wavelengths
Wavelength, Zoom, Focus, Iris, Intensity and Mode Select [ALIGN]   [VIEW]	Remote control for quick adjustments
Piezo-electric Phase Shifter	The ultimate in accuracy
CCD Camera 768(H) x 494(V) pixels	High resolution
Durango Universal Interferometry Software*	Windows environment PV and rms in users choice of units High level of repeatability Excellent reproducibility Large choice of graphic displays Dynamic Sections 3-D OPD Plot Reference Subtraction MTF and PSF graphics and plots Zernike Polynomials available for all measurements Seidel Coefficients available
3 GHz computer	For high speed data reduction and phase shift control
19-inch TFT Flat Screen Monitor	For easy viewing
Live interferogram on computer monitor	For quick inspection with no extra video monitor
Reference surface an integral part of the interferometer and always aligned to collimated beam.	No need to purchase a separate Transmission Fat. No need to adjust Tip/Tilt of a Transmission Flat
Tip/Tilt Fixture and Bayonet mount for attachment of Transmission Spheres for either wavelength. (Transmission Spheres not provided)	Interferometer can accommodate either Plano of Spherical test Pieces at either wavelength
1/50 wave at 1550 nM,  1/20 wave at 632.8 nM	High Accuracy
Repeatability	1/300 wave PV,  1/1000 wave rms
Reproducibility	Excellent
Data acquisition Time 30 milliseconds (typical) Data reduction time  ~3 seconds (typical)	Fast!
Dimensions (L x W x H) 20 x 18 x 10 (inches)	Small footprint
Weight 75 pounds (34 kg) approximately	Solidly built for high stability
Manual	Illustrated Operator's Manual
Power  115/240 Volts  50/60 Hz	Wired with proper plug for user's power system
Warranty	Standard one-year limited warranty against defective components or workmanship